Thin Film Heat Transfer at the Contact Line

The information of liquid film profile near a three-phase contact line is critical for a comprehensive understanding of various wetting and phase-change phenomena. We applied a state-of-the-art atomic force microscopy (AFM) under tapping mode (TM) to achieve a high-power scanning across the contact line. Within a scale of several to tens of microns, a highly linear film profile is observed near the contact line, based on which the contact angle is extracted.Read more